64th ISI World Statistics Congress - Ottawa, Canada

64th ISI World Statistics Congress - Ottawa, Canada

Goodness-of-fit tests based on the multiplicative memoryless property of the Pareto type I distribution

Author

NL
Ndwandwe Lethani

Co-author

  • J
    J.S. Allison
  • I
    I.J.H. Visagie
  • L
    L. Santana

Abstract

In this presentation we propose new goodness-of-fit tests for the Pareto type I distribution. These test are based on the multiplicative memoryless property that characterises this distribution. We present the results of a Monte Carlo study where it is shown that the proposed tests perform well compared to other tests in the literature.